New aspects in electro-optic sampling-Reference-Cited by-同舟云学术

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New aspects in electro-optic sampling

Published:1996-02 Issue:1-4 Volume:31 Page:365-376
ISSN:0167-9317
Container-title:Microelectronic Engineering
language:en
Short-container-title:Microelectronic Engineering

Author:

Mertin W.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference52 articles.

1. Emerging technologies;Goel,1992

2. H. Dämbkes and M. Berroth, Demands for interior testing of high frequency electronic devices, this issue

3. Hewlett-Packard Application Note HP 54124T

4. Hewlett-Packard Application Note HP 8510

5. Electronic wafer probing techniques;Schumacher,1990

Cited by 7 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Electro-Optic Sampling and Charge-Density Probe;Contactless VLSI Measurement and Testing Techniques;2017-11-17

2. Comparison of Contactless Testing Methodologies;Contactless VLSI Measurement and Testing Techniques;2017-11-17

3. Contactless Testing and Diagnosis Techniques;Advanced Circuits for Emerging Technologies;2012-05-07

4. Comparison of Contactless Measurement and Testing Techniques to a New All-Silicon Optical Test and Characterization Method;IEEE Transactions on Instrumentation and Measurement;2005-10

5. Thermometry and Thermal Transport in Micro/Nanoscale Solid-State Devices and Structures;Journal of Heat Transfer;2001-12-07

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