Author:
Bellingham J.,Dowsett M.G.,Collart E.,Kirkwood D.
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry
Reference9 articles.
1. Depth profiling of shallow arsenic implants in silicon using SIMS
2. M.G. Dowsett, these proceedings.
3. M.G. Dowsett, N.S. Smith, R. Bridgeland, D. Richards, A.C. Lovejoy, P. Pedrick, SIMS X, Wiley, New York, 1997, 367 pp.
4. Profile distortions and atomic mixing in SIMS analysis using oxygen primary ions
5. Quantitative analysis of interfacial impurities using secondary‐ion mass spectrometry
Cited by
10 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献