1. I.S. Gilmore, M.P. Seah, J.E. Johnstone: Quantification issues in ToF-SIMS and AFM coanalysis in two-phase systems, exampled by a polymer blend, Surf. Interface Anal. 35, 888 (2003)
2. ASTM: Annual Book of ASTM Standards, Vol. 03.06 (ASTM, West Conshohocken 2003)
3. ISO: List of Technical Committees (International Organization for Standardization, Geneva) http://www.iso.org/iso/standards_development/technical_committees/list_of_iso_technical_committees.htm http://www.iso.or
4. NPL: Surface and Nano-Analysis (National Physical Laboratory, Teddington) http://www.npl.co.uk/nanoanalysis
5. NIST: Surface Data, NIST Scientific and Technical Data Base (NIST, Gaithersburg) http://www.nist.gov/srd/surface.cfm