Enabling focused ion beam sample preparation for application in reverse tip sample scanning probe microscopy
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Publisher
Elsevier BV
Reference15 articles.
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3. A review of focused ion beam milling techniques for TEM specimen preparation;Giannuzzi;Micron,1999
4. Preparation of site specific transmission electron microscopy plan-view specimens using a focused ion beam system;Langford;J. Vacuum Sci. Technol. B: Microelect. Nanomet. Struct.Proc. Measure. Phenomena,2001
5. Preparation of transmission electron microscopy cross-section specimens using focused ion beam milling;Langford;J. Vac. Sci. Technol. A,2001
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