Author:
Giannuzzi L. A.,Drown J. L.,Brown S. R.,Irwin R. B.,Stevie F. A.
Abstract
AbstractA site specific technique for cross-section transmission electron microscopy specimen preparation of difficult materials is presented. Focused ion beams are used to slice an electron transparent sliver of the specimen from a specific area of interest. Micromanipulation lift-out procedures are then used to transport the electron transparent specimen to a carbon coated copper grid for subsequent TEM analysis. The experimental procedures are described in detail and an example of the lift-out technique is presented.
Publisher
Springer Science and Business Media LLC
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