Elemental quantification using electron energy-loss spectroscopy with a low voltage scanning transmission electron microscope (STEM-EELS)-Reference-Cited by-同舟云学术

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Elemental quantification using electron energy-loss spectroscopy with a low voltage scanning transmission electron microscope (STEM-EELS)

Published:2024-08 Issue: Volume:262 Page:113977
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Dumaresq Nicolas^ORCID,Brodusch Nicolas,Bessette Stéphanie,Gauvin Raynald

Funder

Hydro-Québec

NSERC

Publisher

Elsevier BV

Reference33 articles.

1. Single atom identification by energy dispersive x-ray spectroscopy;Lovejoy;Appl. Phys. Lett.,2012

2. EELS of “thick” specimens;Egerton;Ultramicroscopy.,1991

3. Electron Energy-Loss Spectroscopy in the Electron Microscope;Egerton,2011

4. Coincidence detection of EELS and EDX spectral events in the electron microscope;Jannis;Appl. Sci.,2021

5. High spatial resolution energy dispersive X-ray spectrometry in the SEM and the detection of light elements including lithium;Simon Burgess;Micro. Anal.,2013

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