Preparation of transmission electron microscopy cross-section specimens using focused ion beam milling-Reference-Cited by-同舟云学术

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Preparation of transmission electron microscopy cross-section specimens using focused ion beam milling

Published:2001-09 Issue:5 Volume:19 Page:2186-2193
ISSN:0734-2101
Container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
language:en
Short-container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films

Author:

Langford R. M.,Petford-Long A. K.

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

http://avs.scitation.org/doi/pdf/10.1116/1.1378072

Cited by 233 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. Fabrication of Microcrystals by Focused Ion Beam for Surface Analyses;Vacuum and Surface Science;2024-07-10

3. Enabling focused ion beam sample preparation for application in reverse tip sample scanning probe microscopy;Micro and Nano Engineering;2024-06

4. An investigation into RESZ (RE = Yb, Er, Gd, Sm) materials for CMAS resistance in thermal barrier coatings;Journal of the European Ceramic Society;2024-06

5. Atomic-Scale Characterization of Microscale Battery Particles Enabled by a High-Throughput Focused Ion Beam Milling Technique;ACS Omega;2024-04-06

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