Novel scheme for the preparation of transmission electron microscopy specimens with a focused ion beam
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Published:1993-11
Issue:6
Volume:11
Page:2021
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ISSN:0734-211X
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Container-title:Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
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language:
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Short-container-title:J. Vac. Sci. Technol. B
Author:
Overwijk M. H. F.
Publisher
American Vacuum Society
Subject
General Engineering
Cited by
233 articles.
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