Upheaving Self-Heating Effects from Transistor to Circuit Level using Conventional EDA Tool Flows

Author:

Klemme Florian1,Salamin Sami2,Amrouch Hussam1

Affiliation:

1. University of Stuttgart,Germany

2. Hyperstone Company,Konstanz,Germany

Funder

University of Stuttgart

Publisher

IEEE

Reference14 articles.

1. Device to Circuit Framework for Activity-Dependent NBTI Aging in Digital Circuits

2. Machine Learning for Circuit Aging Estimation under Workload Dependency

3. The epfl combinational benchmark suite;amaru;Proceedings of the 24th International Workshop on Logic & Synthesis (IWLS),2015

4. Open Cell Library in 15nm FreePDK Technology

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1. On the Severity of Self-Heating in FDSOI at Cryogenic Temperatures: In-depth Analysis from Transistors to Full Processor;2024 IEEE International Reliability Physics Symposium (IRPS);2024-04-14

2. Machine Learning Unleashes Aging and Self-Heating Effects: From Transistors to Full Processor (Invited Paper);2024 IEEE International Reliability Physics Symposium (IRPS);2024-04-14

3. Accelerating Device-Circuit Self-Heating Simulations with Dynamic Time Evolution for GAAFET;2024 IEEE International Reliability Physics Symposium (IRPS);2024-04-14

4. Electrothermal Modeling of Multi-Nanosheet FETs With Various Layouts;IEEE Transactions on Electron Devices;2024-04

5. Transistor Self-Heating-Aware Synthesis for Reliable Digital Circuit Designs;IEEE Transactions on Circuits and Systems I: Regular Papers;2023-12

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