Machine Learning for Circuit Aging Estimation under Workload Dependency

Author:

Klemme Florian,Amrouch Hussam

Publisher

IEEE

Cited by 10 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Machine Learning Unleashes Aging and Self-Heating Effects: From Transistors to Full Processor (Invited Paper);2024 IEEE International Reliability Physics Symposium (IRPS);2024-04-14

2. Heterogeneous Graph Attention Network Based Statistical Timing Library Characterization with Parasitic RC Reduction;2024 29th Asia and South Pacific Design Automation Conference (ASP-DAC);2024-01-22

3. Functionally Possible Path Delay Faults With High Functional Switching Activity;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2024

4. Learning-Oriented Reliability Improvement of Computing Systems From Transistor to Application Level;2023 Design, Automation & Test in Europe Conference & Exhibition (DATE);2023-04

5. Upheaving Self-Heating Effects from Transistor to Circuit Level using Conventional EDA Tool Flows;2023 Design, Automation & Test in Europe Conference & Exhibition (DATE);2023-04

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