Learning-Oriented Reliability Improvement of Computing Systems From Transistor to Application Level-Reference-Cited by-同舟云学术

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Learning-Oriented Reliability Improvement of Computing Systems From Transistor to Application Level

Published:2023-04 Issue: Volume: Page:
ISSN:
Container-title:2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)
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Author:

Ranjbar Behnaz¹,Klemme Florian²,Genssler Paul R.²,Amrouch Hussam²,Jung Jinhyo³,Dave Shail⁴,So Hwisoo³,Lee Kyongwoo³,Shrivastava Aviral⁴,Lin Ji-Yung⁵,Weckx Pieter⁵,Mishra Subrat⁵,Catthoor Francky⁵,Biswas Dwaipayan¹,Kumar Akash¹

Affiliation:

1. Technische Universität Dresden,Chair of Processor Design, CFAED,Dresden,Germany

2. University of Stuttgart,Chair for Semiconductor Test and Reliability (STAR),Stuttgart,Germany

3. Yonsei University,South Korea

4. School of Computing and Augmented Intelligence, Arizona State University,USA

5. IMEC,Leuven,Belgium

Funder

National Science Foundation

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10136870/10136706/10137182.pdf?arnumber=10137182

Reference61 articles.

1. All-in-Memory Brain-Inspired Computing Using FeFET Synapses

2. TACLeBench: A benchmark collection to support worst-case execution time research;falk;6th Intl Workshop on Worst-Case Execution Time (WCET) Analysis,0

3. Scalable Machine Learning to Estimate the Impact of Aging on Circuits Under Workload Dependency

4. Real-time dynamic voltage scaling for low-power embedded operating systems

5. Classification Using Hyperdimensional Computing: A Review

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