Scalable Machine Learning to Estimate the Impact of Aging on Circuits Under Workload Dependency-Reference-Cited by-同舟云学术

Scalable Machine Learning to Estimate the Impact of Aging on Circuits Under Workload Dependency

Published:2022-05 Issue:5 Volume:69 Page:2142-2155
ISSN:1549-8328
Container-title:IEEE Transactions on Circuits and Systems I: Regular Papers
language:
Short-container-title:IEEE Trans. Circuits Syst. I

Author:

Klemme Florian¹^ORCID,Amrouch Hussam¹^ORCID

Affiliation:

1. Chair of Semiconductor Test and Reliability (STAR), Faculty of Computer Science, Electrical Engineering and Information Technology, University of Stuttgart, Stuttgart, Germany

Funder

Advantest as a part of the Graduate School Intelligent Methods for Test and Reliability (GS-IMTR), University of Stuttgart

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx7/8919/9763566/09704874.pdf?arnumber=9704874

Reference19 articles.

1. Scikit-learn: Machine learning in Python;pedregosa;J Mach Learn Res,2011

2. Nonlinear Component Analysis as a Kernel Eigenvalue Problem

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