Erbium-doped Si1-xGex/Si structures for light emitting diodes-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Erbium-doped Si1-xGex/Si structures for light emitting diodes

Published:2000-02-01 Issue:2 Volume:15 Page:91-97
ISSN:0268-1242
Container-title:Semiconductor Science and Technology
language:
Short-container-title:Semicond. Sci. Technol.

Author:

Naveed A T,Evans-Freeman J H,Vernon-Parry K D,Wright A C,Houghton D C,Peaker A R

Publisher

IOP Publishing

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference27 articles.

1. 1.54‐μm luminescence of erbium‐implanted III‐V semiconductors and silicon

2. Impurity enhancement of the 1.54‐μm Er3+luminescence in silicon

3. Temperature dependence and quenching processes of the intra-4fluminescence of Er in crystalline Si

4. Room-temperature 1.54 μm electroluminescence from erbium-doped Si/SiGe waveguides

5. Photo- and electroluminescence characterization of erbium doped SiGe

Cited by 9 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Defect production in strained p-type Si1−xGex by Er implantation;Journal of Applied Physics;2011-01

2. The impact of erbium incorporation on the structure and photophysics of silicon–germanium nanowires;Nanoscale;2010

3. The effect of hole confinement on photoluminescence from Er in SiGe/Si quantum wells;Materials Science and Engineering: B;2008-01

4. Single and coupled quantum wells: SiGe;Optical Properties. Part 3;2007

5. Enhancing effect of tensile strain on photoluminescence of Er in Si on a SiGe layer;Physica B: Condensed Matter;2003-12

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3