Imaging and manipulation of the Si(100) surface by small-amplitude NC-AFM at zero and very low applied bias
Author:
Publisher
IOP Publishing
Subject
Condensed Matter Physics,General Materials Science
Reference51 articles.
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3. Atomic defect classification of the H–Si(100) surface through multi-mode scanning probe microscopy;Beilstein Journal of Nanotechnology;2020-09-07
4. Nano-contact microscopy of supracrystals;Beilstein Journal of Nanotechnology;2015-05-29
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