Influence of tip-surface interactions and surface defects on Si(100) surface structures by low-temperature (5 K) scanning tunneling microscopy
Author:
Publisher
American Physical Society (APS)
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.69.121301/fulltext
Reference16 articles.
1. Direct observation of an increase in buckled dimers on Si(001) at low temperature
2. Anomalous flipping motions of buckled dimers on the Si(001) surface at 5 K
3. p(2×2)Phase of Buckled Dimers of Si(100) Observed onn-Type Substrates below 40 K by Scanning Tunneling Microscopy
4. Phase transition of the Si(001) surface below 100 K
5. Extrinsic structure changes by STM at 65 K on Si(001)
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