Comprehensive GaN-on-Si power device platform: epitaxy, device, reliability and application

Author:

Wong Roy K-YORCID,Hao Ronghui,Chou Allen,Zou Y B,Shen J Y,Li Sichao,Yang C,Hu Tiger,Chen F,Zhang J H,Zhang Ray,Cao Kenny,Chen L L,Zhao Thomas,He Simon,Lee Seiya,Zhang Martin,Wu Marco,Lee John,Chen P W,Xie Andy,Zhang Justin,Chen H Y,Zhou D,Chiu H C,Zhang Jeff

Publisher

IOP Publishing

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference33 articles.

Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Effect of hydrogen poisoning on p-gate AlGaN/GaN HEMTs;Journal of Physics D: Applied Physics;2024-07-17

2. Comprehensive Study of Human-Body-Model Electrostatic Discharge on p-GaN Gate Power HEMT with AlGaN Barrier Spacers;2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD);2024-06-02

3. Gate Lifetime of P-Gate GaN HEMT in Inductive Power Switching;2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD);2023-05-28

4. 3.0-V-Threshold-Voltage p-GaN HEMTs with Low-Loss Reverse Conduction capability;2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD);2023-05-28

5. The melt-back etching effect of the residual Ga in the reactor for GaN grown on (111) Si;AIP Advances;2022-09-01

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