Automated Hall profiling system for the characterisation of semiconductors at room and liquid nitrogen temperatures-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Automated Hall profiling system for the characterisation of semiconductors at room and liquid nitrogen temperatures

Published:1988-05 Issue:5 Volume:21 Page:470-479
ISSN:0022-3735
Container-title:Journal of Physics E: Scientific Instruments
language:
Short-container-title:J. Phys. E: Sci. Instrum.

Author:

Blight S R,Nicholls R E,Sangha S P S,Kirby P B,Teale L,Hiscock S P,Stewart C P

Publisher

IOP Publishing

Subject

General Physics and Astronomy,General Engineering,General Materials Science,Instrumentation

Link

http://stacks.iop.org/0022-3735/21/i=5/a=011/pdf

Reference16 articles.

1. Automatic electrochemical profiling of Hall mobility in semiconductors

2. Electrical Behavior of Group III and V Implanted Dopants in Silicon

3. Growth Of Cadmium Mercury Telluride (CMT) By Mercury-Rich Liquid Phase Epitaxy (LPE)

4. Determination of doping and mobility profiles by automatic electrical measurements and anodic stripping

Cited by 10 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Electrically active and hydrogen passivated Zn in GaAs/AlGaAs specifically distinguished during secondary ion mass spectrometry depth profiling;Journal of Analytical Atomic Spectrometry;2021

2. N-type heavy doping with ultralow resistivity in Ge by Sb deposition and pulsed laser melting;Applied Surface Science;2020-04

3. A differential Hall effect measurement method with sub-nanometre resolution for active dopant concentration profiling in ultrathin doped Si1−xGex and Si layers;Beilstein Journal of Nanotechnology;2018-07-05

4. Hall and Seebeck measurements estimate the thickness of a (buried) carrier system: Identifying interface electrons in In-doped SnO2 films;Applied Physics Letters;2015-12-21

5. Doping characterization for germanium-based microelectronics and photovoltaics using the differential Hall technique;Applied Physics Letters;2012-04-23

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3