Electrically active and hydrogen passivated Zn in GaAs/AlGaAs specifically distinguished during secondary ion mass spectrometry depth profiling

Author:

Wójcik Adrianna12345ORCID,Kolkowski Walery673,Pasternak Iwona67358,Strupiński Włodzimierz67358,Kozdra Sylwia123ORCID,Michałowski Paweł Piotr123ORCID

Affiliation:

1. Łukasiewicz Research Network - Institute of Microelectronics and Photonics

2. 02-668 Warsaw

3. Poland

4. Institute of Experimental Physics

5. Faculty of Physics

6. VIGO SYSTEM

7. 05-850 Ożarów Mazowiecki

8. Warsaw University of Technology

Abstract

A novel method of measuring active and hydrogen-passivated (inactive) impurity depth profiles using Secondary Ion Mass Spectrometry.

Funder

Narodowe Centrum Badan i Rozwoju

Narodowe Centrum Nauki

Publisher

Royal Society of Chemistry (RSC)

Subject

Spectroscopy,Analytical Chemistry

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