The X-ray calibration of silicon p-i-n diodes between 1.5 and 17.4 keV
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,General Engineering,General Materials Science,Instrumentation
Link
http://stacks.iop.org/0022-3735/13/i=6/a=008/pdf
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1. Spectral Analysis of X-Rays from Laser-Induced Plasmas†
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