Investigation into the aging effect of experiment use on x-ray diode photocathodes, and the calibration ofp-i-nsilicon diodes
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1537857
Reference7 articles.
1. Spectral response calibrations of x-ray diode photocathodes in the 50–5900 eV photon energy region
2. The X-ray calibration of silicon p-i-n diodes between 1.5 and 17.4 keV
3. Flat‐response, subkiloelectronvolt x‐ray detector with a subnanosecond time response
4. Photoelectric quantum efficiencies and filter window absorption coefficients from 20 eV to 10 KeV
5. Filtered x-ray diode diagnostics fielded on the Z accelerator for source power measurements
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2. Effect of gold photocathode contamination on a flat spectral response X-ray diode;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2018-03
3. Diagnosing x-ray power and energy of tungsten wire array z-pinch with a flat spectral response x-ray diode;Review of Scientific Instruments;2015-11
4. $X$-Pinch Experiments on 1-MA “QiangGuang-1” Facility;IEEE Transactions on Plasma Science;2010-04
5. Experimental study on K-shell radiation production of aluminum wire array Z-pinch at Qiangguang-I facility;Acta Physica Sinica;2009
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