A Time‐Resolved Ross Filter System for Measuring X‐Ray Spectra in Z‐Pinch Plasma Focus Devices-Reference-Cited by-同舟云学术

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A Time‐Resolved Ross Filter System for Measuring X‐Ray Spectra in Z‐Pinch Plasma Focus Devices

Published:1971-12 Issue:12 Volume:42 Page:1823-1824
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

van Paassen Hugo L. L.

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1685014

Reference1 articles.

1. A New Method of Spectroscopy for Faint X-Radiations

Cited by 7 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Soft X-Ray Spectra of High Temperature Argon Plasma for Potential Cell Treatment;Sains Malaysiana;2023-11-30

2. Development of a quasi-coaxis dual-energy flat spectral response X-ray imaging instrument for measuring hotspot electron temperature;Optics Express;2022-03-01

3. A balanced filterless K-edge energy window multilayer detector for dual energy computed tomography;SPIE Proceedings;2010-03-04

4. The X-ray calibration of silicon p-i-n diodes between 1.5 and 17.4 keV;Journal of Physics E: Scientific Instruments;1980-06

5. Study of the x‐ray production mechanism of a dense plasma focus;Journal of Applied Physics;1974-03

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