Microanalysis with Ultrasoft X-Radiations

Author:

Henke Burton L.

Publisher

Springer US

Reference11 articles.

1. B. L. Henke, “Measurement in the 10 to 100 Angstrom X-Ray Region,” Advances in X-Ray Analysis, Vol. 4, 1961, University of Denver, Plenum Press, New York, pp. 224–279.

2. B. L. Henke and Jesse W. M. DuMond, “Submicroscopic Structure Determination with Long Wavelength X-Ray Diffraction,” J. Appl. Phys., Vol. 26, 1955, pp. 903–917.

3. B.L. Henke and J.C. Miller, “Ultrasoft X-Ray Interaction Coefficients,” Technical Report No. 3 — AFOSR TN 59-895, 1959.

4. L.G. Parrat, “Surface Studies of Solids by Total Reflection of X-Rays,” Phys. Rev., Vol. 95, 1954, pp. 359–369.

5. B. L. Henke, “X-Ray Microscopy” Encyclopaedia of Microscopy, G. L. Clark, Editor, Reinhold Publishing Co., New York, 1961, pp. 675–693.

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