Transmission Electron Microscopy on Memristive Devices: An Overview
Author:
Affiliation:
1. Kiel University, Faculty of Engineering, Institute for Materials Science, Kiel 24143, Germany
2. Karlsruhe Institute of Technology, Institute of Nanotechnology, Hermann-von-Helmholtz-Platz 1, Eggenstein-Leopoldshafen 76344, Germany
Funder
Deutsche Forschungsgemeinschaft(DFG)
Publisher
Korean Society of Electron Microscopy
Link
http://pdf.medrang.co.kr/KJM/2016/046/KJM046-04-08.pdf
Reference67 articles.
1. Bulk mixed ion electron conduction in amorphous gallium oxide causes memristive behaviour
2. Switching of Cu/MoO x /TiN CBRAM at MoO x /TiN interface
3. Neuromorphic Atomic Switch Networks
4. Chemical and structural properties of conducting nanofilaments in TiN/HfO2-based resistive switching structures
5. Unipolar resistive switching characteristics of ZnO thin films for nonvolatile memory applications
Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Critical Discussion of Ex situ and In situ TEM Measurements on Memristive Devices;Springer Series on Bio- and Neurosystems;2023-09-20
2. Influence of electrolyte selection on performance of tantalum anodic oxide memristors;Applied Surface Science;2021-11
3. Impact of vacuum on the resistive switching in HfO2-based conductive-bridge RAM with highly-doped silicon bottom electrode;Materials Science and Engineering: B;2021-09
4. Recent Progress in Selector and Self‐Rectifying Devices for Resistive Random‐Access Memory Application;physica status solidi (RRL) – Rapid Research Letters;2021-07-26
5. Fabrication and Application of TEM-Compatible Sample Grids for Ex Situ Electrical Probing;IFMBE Proceedings;2019-09-18
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3