Fabrication and Application of TEM-Compatible Sample Grids for Ex Situ Electrical Probing
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Springer International Publishing
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http://link.springer.com/content/pdf/10.1007/978-3-030-31866-6_15
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3. Neelisetty, K.K., Mu, X., Gutsch, S., Vahl, A., Molinari, A., von Seggern, F., Kübel, C.: Electron beam effects on oxide thin films—structure and electrical property correlations. Microsc. Microanal. 1–9 (2019). https://doi.org/10.1017/s1431927619000175
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1. Critical Discussion of Ex situ and In situ TEM Measurements on Memristive Devices;Springer Series on Bio- and Neurosystems;2023-09-20
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