Impact of vacuum on the resistive switching in HfO2-based conductive-bridge RAM with highly-doped silicon bottom electrode

Author:

Humood Khaled,Saylan Sueda,Abi Jaoude Maguy,Mohammad Baker,Ravaux Florent

Funder

Khalifa University of Science and Technology

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference91 articles.

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4. T. Li X. Bi N. Jing X. Liang L. Sneak-path based test and diagnosis for 1R RRAM crossbar using voltage bias technique, 2017 54th ACM/EDAC/IEEE Design Automation Conference (DAC). https://doi.org/10.1145/3061639.3062318.

5. Stateful memristor-based search architecture;Halawani;IEEE Transactions on Very Large Scale Integration (VLSI) Systems,2018

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