Author:
Balboni R.,Frabboni S.,Armigliato A.
Subject
Metals and Alloys,Physics and Astronomy (miscellaneous),Condensed Matter Physics,General Materials Science,Electronic, Optical and Magnetic Materials
Reference28 articles.
1. Armigliato, A., Balboni, R., De Wolf, I., Frabboni, S., Janssens, K. G. F. and Vanhellemont, J. 1993.Microscopy of Semiconducting Materials, Institute of Physics Conference Series No. 134 229Bristol: Institute of Physics.
2. Analytical electron microscopy of Si1−xGex/Si heterostructures and local isolation structures
3. Electron and ion beam analysis of composition and strain in Si-x Ge x /Si heterostructures
4. Structural and analytical characterization of Si1-x Gex /Si heterostructures by Rutherford backscattering spectrometry and channeling, analytical electron microscopy and double crystal X-ray diffractometry
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