Ultrahigh GaN:SiO2 etch selectivity by in situ surface modification of SiO2 in a Cl2-Ar plasma
Author:
Affiliation:
1. Lawrence Livermore National Laboratory, Livermore, CA, USA
Funder
Lawrence Livermore National Laboratory
Publisher
Informa UK Limited
Subject
General Materials Science
Link
https://www.tandfonline.com/doi/pdf/10.1080/21663831.2020.1847735
Reference43 articles.
1. GaN Integration Technology, an Ideal Candidate for High-Temperature Applications: A Review
2. Review of GaN-based devices for terahertz operation
3. Review of Commercial GaN Power Devices and GaN-Based Converter Design Challenges
4. Optoelectronic device physics and technology of nitride semiconductors from the UV to the terahertz
5. Zhang Y , Sun M , Piedra D , et al. 1200 V GaN vertical fin power field-effect transistors. In 2017 IEEE Int Electron Devices Meet. (IEDM) 2017 Dec 2-6; San Francisco, California (pp. 9-2). IEEE.
Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Validation of inductively coupled plasma simulation model by laser Thomson scattering experiment;Journal of Plasma Physics;2023-07-25
2. ICP etching of GaN microstructures in a Cl2–Ar plasma with subnanometer-scale sidewall surface roughness;Materials Science in Semiconductor Processing;2022-06
3. Local pressure calibration method of inductively coupled plasma generator based on laser Thomson scattering measurement;Scientific Reports;2022-03-18
4. Influence of the carrier wafer during GaN etching in Cl2 plasma;Journal of Vacuum Science & Technology A;2022-03
5. Evidence of an oxidation induced phase transformation for a delta phase plutonium-gallium alloy;Corrosion Science;2022-01
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3