Reference survey spectra of elemental solid measured with Cr Kα photons as a tool for Quases analysis (1): Transition metals period 4 elements (Sc, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn)
Author:
Affiliation:
1. Imec, MCACSA, Kapeldreef 75, 3001 Leuven, Belgium
2. Instituut voor Kern-en Stralingsfysica, K.U. Leuven, Celestijnenlaan 200D, Leuven B-3001, Belgium
Publisher
American Vacuum Society
Subject
Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference14 articles.
1. Determination of the input parameters for inelastic background analysis combined with HAXPES using a reference sample
2. Theoretical study toward rationalizing inelastic background analysis of buried layers in XPS and HAXPES
3. Analysis of buried interfaces in multilayer device structures with hard XPS (HAXPES) using a CrKα source
4. Quantitative determination of elemental diffusion from deeply buried layers by photoelectron spectroscopy
5. Effective inelastic scattering cross-sections for background analysis in HAXPES of deeply buried layers
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3. High-energy x-ray photoelectron spectroscopy Cr Kα measurement of bulk iron;Surface Science Spectra;2023-08-15
4. High energy x-ray photoelectron spectroscopy (HAXPES) Cr Kα measurement of bulk chromium;Surface Science Spectra;2023-08-15
5. Reference survey spectra of elemental solid measured with Cr Kα photons as a tool for Quases analysis (1): Transition metals period 4 elements (Sc, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn);Surface Science Spectra;2022-09-16
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