Author:
Zborowski C.,Renault O.,Torres A.,Yamashita Y.,Grenet G.,Tougaard S.
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry
Cited by
24 articles.
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1. HAXPES: Inelastic background for characterization of nanostructured materials;Surface and Interface Analysis;2023-11-28
2. Investigating the structure of the oxide on Ni‐Cr‐Mo alloys while presenting a method for analysis of complex oxides using QUASES;Surface and Interface Analysis;2023-07-09
3. Assessing advanced methods in XPS and HAXPES for determining the thicknesses of high-k oxide materials: From ultra-thin layers to deeply buried interfaces;Applied Surface Science;2023-01
4. Reference survey spectra of elemental solid measured with Cr Kα photons as a tool for Quases analysis (4): Group III and IV elements (B, Al, In, C, Si, Ge, Sn, Pb);Surface Science Spectra;2022-09-16
5. Reference survey spectra of elemental solid measured with Cr Kα photons as a tool for Quases analysis (1): Transition metals period 4 elements (Sc, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn);Surface Science Spectra;2022-09-16