Finite Element Method for Electromigration Study
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Publisher
Springer London
Link
http://link.springer.com/content/pdf/10.1007/978-0-85729-310-7_4.pdf
Reference62 articles.
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5. Sasagawa K, Nakamura N, Saka M, Abe H (2002) Governing parameter for electromigration damage in the polycrystalline line covered with a passivation layer. J Appl Phys 91:1882
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