Self-heating aware EM reliability prediction of advanced CMOS technology by kinetic Monte Carlo method-Reference-Cited by-同舟云学术

Self-heating aware EM reliability prediction of advanced CMOS technology by kinetic Monte Carlo method

Published:2020-04 Issue: Volume:107 Page:113626
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Cai Linlin,Chen Wangyong,Huang Peng,Liu Xiaoyan,Zhao Yudi,Zhang Xing

Funder

National Natural Science Foundation of China

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

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