Temperature Influence on Dielectric Tunnel FET Characterization and Subthreshold Characterization

Author:

Kanithan S.,Anthoniraj S.,Manikandan P.,Ramaswamy T.,Kumar Ravi,Vignesh N. ArunORCID,Panigrahy Asisa Kumar

Publisher

Springer Science and Business Media LLC

Subject

Electronic, Optical and Magnetic Materials

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