Test Resource Partitioning Based on Efficient Response Compaction for Test Time and Tester Channels Reduction-Reference-Cited by-同舟云学术

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Test Resource Partitioning Based on Efficient Response Compaction for Test Time and Tester Channels Reduction

Published:2005-03 Issue:2 Volume:20 Page:201-209
ISSN:1000-9000
Container-title:Journal of Computer Science and Technology
language:en
Short-container-title:J Comput Sci Technol

Author:

Han Yin-He,Li Xiao-Wei,Li Hua-Wei,Chandra Anshuman

Publisher

Springer Science and Business Media LLC

Subject

Computational Theory and Mathematics,Computer Science Applications,Hardware and Architecture,Theoretical Computer Science,Software

Link

http://link.springer.com/content/pdf/10.1007/s11390-005-0201-3.pdf

Reference20 articles.

1. Mitra S, Kim K S. X-compact: An efficient response compaction technique for test cost reduction. In Proc. International Test Conference, Baltimore, USA, 2002, pp.311?320.

2. Chandra A, Chakrabarty K. Test resource partitioning for SoCs. IEEE Design & Test of Computers, 2001, 18(9): 80?91.

3. Reda S, Orailoglu A. Reducing test application time through test data mutation encoding. In Proc. Design of Automation and Test in Europe (DATE), Paris, France, 2002, pp.387?393.

4. Volkerink E H, Khoche A, Mitra S. Packet-based input test data compression techniques. In Proc. Int. Test Conference, Baltimore, USA, 2002, pp.154?163.

5. Nourani M, Chin J. Testing high-speed SoCs using low-speed ATEs. In Proc. VLSI Test Symposium, Monterey, USA, 2002, pp.133?138.

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