1. Test Compression for Launch-on-Capture Transition Fault Testing;ACM T DES AUTOMAT EL;2024
2. Low cost production scan chain test for compression based designs;2023 IEEE International Test Conference (ITC);2023-10-07
3. Incomplete Testing of SOC;Journal of Electronic Testing;2023-05-29
4. PPA Optimization of Test Points in Automotive Designs;2022 IEEE International Test Conference (ITC);2022-09
5. Selective Multiple Capture Test (SMART) XLBIST;2022 IEEE International Test Conference India (ITC India);2022-07-24