Author:
Jin Song,Han Yinhe,Li Huawei,Li Xiaowei
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software
Cited by
14 articles.
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1. Functionally Possible Path Delay Faults With High Functional Switching Activity;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2024
2. Storage-Based Logic Built-In Self-Test with Variable-Length Test Data;2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2022-10-19
3. A Pruning and Feedback Strategy for Locating Reliability-Critical Gates in Combinational Circuits;IEEE Transactions on Reliability;2022
4. Zoom-In Feature for Storage-Based Logic Built-In Self-Test;2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2021-10-06
5. Storage-Based Built-In Self-Test for Gate-Exhaustive Faults;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2021-10