Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Cited by
8 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. A Storage Based LBIST Scheme for Logic Diagnosis;2024 IEEE 42nd VLSI Test Symposium (VTS);2024-04-22
2. Reduced On-chip Storage of Seeds for Built-in Test Generation;ACM Transactions on Design Automation of Electronic Systems;2024-03-14
3. Storage-Based Logic Built-In Self-Test With Cyclic Tests;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-09
4. Storage-Based Logic Built-In Self-Test With Partitioned Deterministic Compressed Tests;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2023-09
5. Fully Deterministic Storage Based Logic Built-In Self-Test;2023 IEEE 41st VLSI Test Symposium (VTS);2023-04-24