A Pruning and Feedback Strategy for Locating Reliability-Critical Gates in Combinational Circuits-Reference-Cited by-同舟云学术

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A Pruning and Feedback Strategy for Locating Reliability-Critical Gates in Combinational Circuits

Published:2022 Issue: Volume: Page:1-15
ISSN:0018-9529
Container-title:IEEE Transactions on Reliability
language:
Short-container-title:IEEE Trans. Rel.

Author:

Xiao Jie¹^ORCID,Zhu Weidong²,Shen Qing³,Long Haixia¹,Lou Jungang³^ORCID

Affiliation:

1. College of Computer Science and Technology, Zhejiang University of Technology, Hangzhou, China

2. School of Software Engineering, Tongji University, Shanghai, China

3. Zhejiang Province Key Laboratory of Smart Management & Application of Modern Agricultural Resources, Huzhou, China

Funder

National Natural Science Foundation of China

Natural Science Foundation of Zhejiang Province

Primary Research and Development Plan of Zhejiang Province

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality

Link

http://xplorestaging.ieee.org/ielx7/24/4378406/09866589.pdf?arnumber=9866589

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Analysis of Combinational Circuit Failure Rate based on Graph Partitioning and Probabilistic Binomial Approach;Journal of Electronic Testing;2024-05-28

2. A Reliability-Critical Path Identifying Method With Local and Global Adjacency Probability Matrix in Combinational Circuits;IEEE Transactions on Computers;2024-01

3. Two sextuple cross-coupled SRAM cells with double-node-upset protection and cost optimization for aerospace applications;Microelectronics Journal;2023-09

4. ICP-RL: Identifying Critical Paths for Fault Diagnosis Using Reinforcement Learning;ACM Transactions on Design Automation of Electronic Systems;2023-07-21

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