NBTI and Power Reduction Using a Workload-Aware Supply Voltage Assignment Approach
Author:
Funder
National Natural Science Foundation of China
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Link
http://link.springer.com/article/10.1007/s10836-018-5707-z/fulltext.html
Reference25 articles.
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3. Bhardwaj S, Wang W, Vattikonda R, Cao Y, Vrudhula S (2006) Predictive Modeling of the NBTI Effect for Reliable Design. Proc. IEEE Custom Integrated Circuits Conference, San Jose, CA, USA, p 189–192. https://doi.org/10.1109/CICC.2006.320885
4. Bian S, Shintani M, Wang Z, Hiromoto M, Chattopadhyay A, Sato T (2016) Runtime NBTI Mitigation for Processor Lifespan Extension via Selective Node Control. Proc. IEEE 25th Asian Test Symposium (ATS), Hiroshima, Japan, p 234–239. https://doi.org/10.1109/ATS.2016.31
5. Bowman KA, Austin BL, Eble JC, Xinghai T, Meindl JD (1999) A physical alpha-power law MOSFET model. IEEE J Solid State Circuits 34(10):1410–1414. https://doi.org/10.1109/4.792617
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