Author:
Agarwal M.,Balakrishnan V.,Bhuyan A.,Kyunglok Kim ,Paul B.C.,Wenping Wang ,Bo Yang ,Yu Cao ,Mitra S.
Cited by
19 articles.
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1. Risk Evaluation of Short-Circuit Fault in Power System;Risk-Based Planning and Operation Strategy Towards Short Circuit Resilient Power Systems;2023
2. Fault-Tolerant Circuits;Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design;2023
3. Research and Analysis on Performance Improvement of Transmission Delay Caused by BTI Aging;The 5th International Conference on Computer Science and Application Engineering;2021-10-19
4. Investigation of the Impact of BTI Aging Phenomenon on Analog Amplifiers;Journal of Electronic Testing;2021-08
5. Risk‐based many‐objective configuration of power system fault current limiters utilising NSGA‐III;IET Generation, Transmission & Distribution;2020-10-19