Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Cited by
2 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Nanoscale CMOS Biasing Circuit for Analog Applications: The Impact of NBTI Degradation;2023 International Conference for Advancement in Technology (ICONAT);2023-01-24
2. Novel BTI Robust Ring-Oscillator-Based Physically Unclonable Function;2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS);2022-09-12