Author:
Agarwal Mridul,Paul Bipul C.,Zhang Ming,Mitra Subhasish
Cited by
179 articles.
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1. Analysis and Protection Solution for Aging DC-Stress Induced Waveform Distortion Issues;2024 Conference of Science and Technology for Integrated Circuits (CSTIC);2024-03-17
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3. Technology for Power Outage Research and Judgment-dependent Data Feature Noise Analysis;EAI Endorsed Transactions on Energy Web;2023-09-22
4. Aging-Induced Failure Prognosis via Digital Sensors;Proceedings of the Great Lakes Symposium on VLSI 2023;2023-06-05
5. Analog/RF Circuit Aging Prediction based on On-Chip Machine Learning;2023 6th International Conference on Artificial Intelligence and Big Data (ICAIBD);2023-05-26