Aging-Induced Failure Prognosis via Digital Sensors
Author:
Affiliation:
1. Univ. of Maryland Baltimore County, Baltimore, MD, USA
2. LTCI, Télécom Paris, Paris, France
3. Secure-IC S.A.S., Paris, France
Publisher
ACM
Link
https://dl.acm.org/doi/pdf/10.1145/3583781.3590204
Reference20 articles.
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3. Circuit Failure Prediction and Its Application to Transistor Aging
4. A comprehensive model for PMOS NBTI degradation: Recent progress
5. Detecting Failures and Attacks via Digital Sensors
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