Impact of Process Mismatch and Device Aging on SR-Latch Based True Random Number Generators

Author:

Bahrami Javad,Ebrahimabadi Mohammad,Guilley Sylvain,Danger Jean-Luc,Karimi Naghmeh

Publisher

Springer Nature Switzerland

Reference26 articles.

1. Sunar, B., Martin, W.J., Stinson, D.R.: A provably secure true random number generator with built-in tolerance to active attacks. IEEE Trans. Comput. 56(1), 109–119 (2007)

2. Peter, M., Schindler, W.: A Proposal for Functionality Classes for Random Number Generators, Version 2.0 (2022). https://www.bsi.bund.de/SharedDocs/Downloads/EN/BSI/Certification/Interpretations/AIS_31_Functionality_classes_for_random_number_generators_e.pdf?__blob=publicationFile &v=5

3. Markettos, A.T., Moore, S.W.: The frequency injection attack on ring-oscillator-based true random number generators. In: Cryptographic Hardware and Embedded Systems (CHES), vol. 5747, pp. 317–331 (2009)

4. Martin, H., Martin-Holgado, P., Peris-Lopez, P., Morilla, Y., Entrena, L.: On the entropy of oscillator-based true random number generators under ionizing radiation. Entropy 20(7), 513 (2018)

5. Hamburg, M., Kocher, P., Marson, M.E.: Analysis of Intel’s Ivy Bridge digital random number generator (2012). http://www.cryptography.com/public/pdf/Intel_TRN G_Report_20120312. pdf

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