Predictive Modeling of the NBTI Effect for Reliable Design-Reference-Cited by-同舟云学术

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Predictive Modeling of the NBTI Effect for Reliable Design

Published:2006-09 Issue: Volume: Page:
ISSN:
Container-title:IEEE Custom Integrated Circuits Conference 2006
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Author:

Bhardwaj Sarvesh,Wang Wenping,Vattikonda Rakesh,Cao Yu,Vrudhula Sarma

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/4114893/4114894/04114936.pdf?arnumber=4114936

Cited by 193 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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