SRBML: A Single-Event-Upset Recoverable and BTI-Mitigated Latch Design for Long-Term Reliability Enhancement-Reference-Cited by-同舟云学术

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SRBML: A Single-Event-Upset Recoverable and BTI-Mitigated Latch Design for Long-Term Reliability Enhancement

Published:2024-08-18 Issue: Volume: Page:1-5
ISSN:
Container-title:2024 IEEE International Test Conference in Asia (ITC-Asia)
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Author:

Xia Fan¹,Zhang Jing¹,Ali Jehad²,Zhang Chunjiong²,Wen Xiaoqing³,Yan Aibin⁴

Affiliation:

1. Anhui University,School of Computer Science and Technology,Hefei,China

2. Ajou University,Department of AI Convergence Network,Suwon,Korea

3. Kyushu Institute of Technology,Department of Computer Science and Networks,Fukuoka,Japan

4. Hefei University of Technology,School of Microelectronic,Hefei,China

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx8/10661305/10661306/10661343.pdf?arnumber=10661343

Reference21 articles.

1. Overcoming Early-Life Failure and Aging for Robust Systems

2. An on-chip NBTI sensor for measuring PMOS threshold voltage degradation

3. Analysis of reliability of flip-flops under transistor aging effects in nano-scale CMOS technology

4. NBTI-aware flip-flop characterization and design

5. Low-Cost Strategy to Mitigate the Impact of Aging on Latches’ Robustness

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