Low-Cost Strategy to Mitigate the Impact of Aging on Latches’ Robustness-Reference-Cited by-同舟云学术

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Low-Cost Strategy to Mitigate the Impact of Aging on Latches’ Robustness

Published:2018-10-01 Issue:4 Volume:6 Page:488-497
ISSN:2168-6750
Container-title:IEEE Transactions on Emerging Topics in Computing
language:
Short-container-title:IEEE Trans. Emerg. Topics Comput.

Author:

Omana M.^ORCID,Edara T.,Metra C.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Computer Science Applications,Human-Computer Interaction,Information Systems,Computer Science (miscellaneous)

Link

http://xplorestaging.ieee.org/ielx7/6245516/8558622/07502162.pdf?arnumber=7502162

Cited by 9 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. SRBML: A Single-Event-Upset Recoverable and BTI-Mitigated Latch Design for Long-Term Reliability Enhancement;2024 IEEE International Test Conference in Asia (ITC-Asia);2024-08-18

2. Silent Data Corruption and Reliability Risks due to Faults Affecting High Performance Microprocessors’ Caches*;2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS);2024-07-03

3. RISC-V-Based Platforms for HPC: Analyzing Non-functional Properties for Future HPC and Big-Data Clusters;Lecture Notes in Computer Science;2023

4. BAS: A BTI-based aging aware synthesis in FPGAs;Microelectronics Reliability;2022-12

5. Restructuring-Based Lifetime Reliability Improvement of Nanoscale Master-Slave Flip-Flops;Lifetime Reliability-aware Design of Integrated Circuits;2022-11-17

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