Aging Prediction and Tolerance for the SRAM Memory Cell and Sense Amplifier
Author:
Funder
Hellenic Foundation for Research and Innovation
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Link
https://link.springer.com/content/pdf/10.1007/s10836-021-05932-6.pdf
Reference31 articles.
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2. Agbo I, Taouil M, Kraak D et al (2017) Integral mpact of BTI, PVT variation, and workload on SRAM sense amplifier. IEEE Transactions on Very Large Scale Integration Systems 25(04):1444–1454
3. Ahmed F, Milor L (2016) Online measurement of degradation due to bias temperature instability in SRAMs. IEEE Transactions on Very Large Scale Integration Systems 24(06):2184–2194
4. Alorda B, Carmona C, Torrens G, Bota S (2016) On-line write margin estimator to monitor performance degradation in SRAM Cores. Proc. IEEE International Symposium on On-Line Testing and Robust System Design, pp 90–95
5. Cacho F, Singh SK, Singh B, Partasarathy C, Pion E, Argoud F, Federspiel X, Pitolet H, Roy D, Huard V (2011) Hot carrier injection degradation induced dispersion: model and circuit-level measurement. Proc. IEEE International Integration Reliability Workshop, pp 137–141
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