Technical Trend of Packaging for Power Semiconductor Modules

Author:

Takahashi Yoshikazu,Morozumi Akira,Ikeda Yoshinari,Nishimura Yoshitaka

Publisher

Japan Institute of Electronics Packaging

Subject

Electrical and Electronic Engineering

Reference10 articles.

1. 2) Y. Nishimura, et al.: “Design of IGBT module packaging for high reliability,” Proceedings PCIM Europe 2010, pp. 249-254, 2010

2. 3) Y. Nishimura, et al.: “Thermal management of IGBT module systems,” Proceedings PCIM Europe 2008, pp. 814-818, 2008

3. 4) A. Morozumi, et al.: “Direct Liquid Cooling Module with High Reliability Solder Joining Technology for Automotive Applications,” Proceedings of The 25th International Symposium on Power Semiconductor Devices & ICs, Kanazawa, pp. 109-112, 2013

4. 5) T. Saitou, et al.: “New assembly technologies for Tjmax=175°C continuous operation guaranty of IGBT module,” ISBN 978-3-8007-3505-1, Proceedings PCIM Europe 2013 conference, pp. 455-461, 2013

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