Author:
Yamato Yuta,Miyase Kohei,Kajihara Seiji,Xiaoqing Wen ,Laung-Terng Wang ,Kochte Michael A.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software
Cited by
6 articles.
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1. Mitigating Test-Induced Yield-Loss by IR-Drop-Aware X-Filling;2023 IEEE 16th International Symposium on Embedded Multicore/Many-core Systems-on-Chip (MCSoC);2023-12-18
2. GPU-Accelerated Estimation and Targeted Reduction of Peak IR-Drop during Scan Chain Shifting;IEICE Transactions on Information and Systems;2023-10-01
3. Power-Aware Testing in the Era of IoT;2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT);2022-10-25
4. On the Efficacy of Scan Chain Grouping for Mitigating IR-Drop-Induced Test Data Corruption;IEICE Transactions on Information and Systems;2021-06-01
5. Targeted Partial-Shift For Mitigating Shift Switching Activity Hot-Spots During Scan Test;2019 IEEE 24th Pacific Rim International Symposium on Dependable Computing (PRDC);2019-12