A 1Tb 3b/Cell 8th-Generation 3D-NAND Flash Memory with 164MB/s Write Throughput and a 2.4Gb/s Interface

Author:

Kim Moosung1,Yun Sung Won1,Park Jungjune1,Park Hyun Kook1,Lee Jungyu1,Kim Yeong Seon1,Na Daehoon1,Choi Sara1,Song Youngsun1,Lee Jonghoon1,Yoon Hyunjun1,Lee Kangbin1,Jeong Byunghoon1,Kim Sanglok1,Park Junhong1,Lee Cheon An1,Lee Jaeyun1,Lee Jisang1,Chun Jin Young1,Jang Joonsuc1,Yang Younghwi1,Moon Seung Hyun1,Choi Myunghoon1,Kim Wontae1,Kim Jungsoo1,Yoon Seokmin1,Kwak Pansuk1,Lee Myunghun1,Song Raehyun1,Kim Sunghoon1,Yoon Chiweon1,Kang Dongku1,Lee Jin-Yub1,Song Jaihyuk1

Affiliation:

1. Samsung Electronics,Hwaseong,Korea

Publisher

IEEE

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2. Achieving Near-Zero Read Retry for 3D NAND Flash Memory;Proceedings of the 29th ACM International Conference on Architectural Support for Programming Languages and Operating Systems, Volume 2;2024-04-27

3. Adjustable onset voltages of embedded LiNbO3 domain-wall selectors for large-scale memory integration;Applied Physics Letters;2024-03-11

4. Optimizing Confined Nitride Trap Layers for Improved Z-Interference in 3D NAND Flash Memory;Electronics;2024-03-08

5. wearMeter: an Accurate Wear Metric for NAND Flash Memory;2024 29th Asia and South Pacific Design Automation Conference (ASP-DAC);2024-01-22

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